Business Wire

JEOL: Release of Schottky Field Emission Scanning Electron Microscope JSM-IT800(i)/(is) Versions

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
Business Wire

JEOL: Release of a New Benchtop Scanning Electron Microscope JCM-7000 Series NeoScope TM

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope TM, ...
Medicine Buffalo

Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment - JEOL JSM-6500F

The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...
Nanowerk

Introduction to Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...